Standard Test Finger | B Test Probe

 Standard Test Finger | B Test Probe; meets the standards EN/IEC 61032 Clause 6.1.2.b, Figure 2, EN/IEC 60950-1 Figure 2a and UL 1278 Figure 8.4.

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Relevant standards: IEC 60884-1, EN/IEC 60335-1, EN/IEC 60065, EN/IEC 60598, EN/IEC 60601, UL 507,

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SKU: MT-I02E Category:
Description

Standard Test Finger | B Test Probe, meets the standards EN/IEC 61032 Clause 6.1.2.b, Figure 2, EN/IEC 60950-1 Figure 2a and UL 1278 Figure 8.4.

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Relevant standards: IEC 60884-1, EN/IEC 60335-1, EN/IEC 60065, EN/IEC 60598, EN/IEC 60601, UL 507,

Standard Test Finger | B Test Probe Technical Parameters

Model/ Parameter HT-I02E HT-I02AE HT-I02BE HT-I02TE
Item Name Standard Test Finger Circular Baffle Test Finger Large Baffle Test Finger Standard Test Finger With Force
Joint 1 30±0.2 30±0.2 30±0.2 30±0.2
Joint 2 60±0.2 60±0.2 60±0.2 60±0.2
Finger Length 80±0.2 80±0.2 100±0.2 80±0.2
Fingertip to Baffle 180±0.2 180±0.2 180±0.2
Cylindrical R2±0.05 R2±0.05 R2±0.05 R2±0.05
Spherical R4±0.05 R4±0.05 R4±0.05 R4±0.05
Fingertip Cutting Bevel Angle 37° 0-10 37° 0-10 37° 0-10 37° 0-10
Fingertip Taper 14°   0-10 14°   0-10 14°   0-10 14°   0-10
Test Finger Diameter Ф12 0-0.05 Ф12 0-0.05 Ф12 0-0.05 Ф12 0-0.05
A-A Section Diameter Ф50 Ф50 Ф50
A-A Section Width 20±0.2 20±0.2
Baffle Diameter Ф75±0.2 Ф75±0.2 Ф125±0.2 Ф75±0.2
Baffle Thickness 5±0.5 5±0.5 5±0.5
Force 10N, 20N, 30N
Applied Standard IEC 61032-1 IEC 60335-1 IEC 60335-2-14 IEC 60529-1