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HomeProbes and Gauges Test Probe With Force
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test probe with force
test probe with force
test probe with force
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Test Probe With Force

Test Probe With Force meet the standard IEC 60884-1 Clause 10.5, Figures 9 and 10. It is designed to test whether the live parts of the shuttered socket-outlets are accessible.

Teklif Al
SKU: MT-I20E, MT-I21E Category: Probes and Gauges
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Description

Test Probe With Force meet the standard IEC 60884-1 Clause 10.5, Figures 9 and 10. It is designed to test whether the live parts of the shuttered socket-outlets are accessible.

Requirement:

Shuttered socket-outlets shall be so constructed that live parts are not accessible with the probes shown in figures 9 and 10.

Application:

The probes are only applied to the entry holes corresponding to the live contacts. They should not touch the live parts.

Test Probe With Force Technical parameters:

Parameter/ Model MT-I20E MT-I21E
Rod diameter (mm) 3 +0,03
0
1 +0,015
0
Rod length (mm) 80±0,5 80±0,5
Stopper diameter (mm) 50 50
Stopper thickness (mm) 5 5
Handle diameter (mm) 30 30
Handle length (mm) 55 55
Force(N) 20 1
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test probe with force

Test Probe With Force