Standard Test Finger | B Test Probe, meets the standards EN/IEC 61032 Clause 6.1.2.b, Figure 2, EN/IEC 60950-1 Figure 2a and UL 1278 Figure 8.4.
This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.
Relevant standards: IEC 60884-1, EN/IEC 60335-1, EN/IEC 60065, EN/IEC 60598, EN/IEC 60601, UL 507,
Standard Test Finger | B Test Probe Technical Parameters
| Model/ Parameter | HT-I02E | HT-I02AE | HT-I02BE | HT-I02TE |
| Item Name | Standard Test Finger | Circular Baffle Test Finger | Large Baffle Test Finger | Standard Test Finger With Force |
| Joint 1 | 30±0.2 | 30±0.2 | 30±0.2 | 30±0.2 |
| Joint 2 | 60±0.2 | 60±0.2 | 60±0.2 | 60±0.2 |
| Finger Length | 80±0.2 | 80±0.2 | 100±0.2 | 80±0.2 |
| Fingertip to Baffle | 180±0.2 | 180±0.2 | — | 180±0.2 |
| Cylindrical | R2±0.05 | R2±0.05 | R2±0.05 | R2±0.05 |
| Spherical | R4±0.05 | R4±0.05 | R4±0.05 | R4±0.05 |
| Fingertip Cutting Bevel Angle | 37° 0-10′ | 37° 0-10′ | 37° 0-10′ | 37° 0-10′ |
| Fingertip Taper | 14° 0-10′ | 14° 0-10′ | 14° 0-10′ | 14° 0-10′ |
| Test Finger Diameter | Ф12 0-0.05 | Ф12 0-0.05 | Ф12 0-0.05 | Ф12 0-0.05 |
| A-A Section Diameter | Ф50 | Ф50 | — | Ф50 |
| A-A Section Width | 20±0.2 | — | — | 20±0.2 |
| Baffle Diameter | Ф75±0.2 | Ф75±0.2 | Ф125±0.2 | Ф75±0.2 |
| Baffle Thickness | 5±0.5 | 5±0.5 | — | 5±0.5 |
| Force | — | — | — | 10N, 20N, 30N |
| Applied Standard | IEC 61032-1 | IEC 60335-1 | IEC 60335-2-14 | IEC 60529-1 |
