Apparatus for Impact Test at Low Temperature

Apparatus for Impact Test at Low Temperature meets the standard of IEC 60884-1 Clause 24.4 Figure 27 and Clause 30.4 Figure 42.

It is used for low temperature mechanical impact test for plugs and portable socket-outlets with enclosures, covers or bodies of by made of elastomeric or thermoplastic material.

In addition, this device is also used for low temperature impact test of pin-insulating sleeves.

Apparatus for Impact Test at Low Temperature

Test Procedure

The apparatus, on a sponge rubber pad, 40 mm thick, is placed, together with the specimens, in a freezer at a temperature of (–15 ± 2) °C for at least specified time.

At the end of this period, each specimen in turn, is placed in position, as shown in figure 27 and figure 42, and the falling weight is allowed to fall from a height of 100 mm.

– For clause 24.4: The mass of the falling weight is (1 000 ± 2) g.

After the test, the specimen shall show no damage within the meaning of this standard.

– For clause 30.4: The mass of the falling weight is (100 ± 1) g. Four impacts are applied successively to the same specimen, rotating it through 90° between impacts.

After the test the specimens are allowed to attain approximately room temperature and are then examined.

No cracks of the insulating sleeves shall be visible with normal or corrected vision without additional magnification.

Technical Parameters

Test speciment	Standard	The mass of the falling weight (g)	Fall height
Plugs and portable socket-outlets with enclosures, covers or bodies of by made of elastomeric or thermoplastic material	IEC 60884-1 Clause 24.4, Figure 27.	1000 ± 2	100 mm
pin-insulating sleeves	IEC 60884-1 Clause 30.4, Figure 42.	100 ± 1	100 mm